వివరాలు

The atomic force microscope (AFM) is extensively used in material science and biological sciences. Characterization of sol-gel thin film surface morphology in sub-micron scale is necessary to evaluate their function properties in a wide variety of applications. It has been known that sub-micron and nanoscale properties control various aspects of functional performance. For example, enhanced transmittance in borosilicate glass (BSG, 91%) over soda lime glass (SLG, 89%) is due to sub-nanometer surface morphology of BSG. This may occur due to its different chemical composition though the refractive indices are comparable.

Model and Make

Park XE7 (Direct On-Axis Manual Focus Optics)

Specifications

  • XY Sample stage: 13 mm x 13 mm
  • Scan Range in XY: 50 µm (max)
  • Scan Range in Z: 12 µm (max)
  • Options: Non-Contact, Contact, Dynamic Contact, Phase Imaging. Heater Stage and Lithographic.