Details

Transmission electron microscope is used to study microstructural features at very fine scale. The instrument is capable of resolving features finer than sub-micron size reaching close to 0.1 nm. Identification of elements using EDS spectrometer and spatial mapping of the same is possible. Phase identification using electron diffraction can be done. Conventional TEM imaging for capturing bright , dark field images and electron diffrcation patterns is also possible. Operating the system in STEM mode aids in creating STEM bright filed and dark field images to understand distribution of phases and elements. 

Model and Make

F200, Jeol Japan

Specifications

  • excitation voltage : 200kV
  • electron source : Cold filed emission source
  • Magnification range:
    • TEM mode : 20X to 1,500,000 X
    • STEM mode: 200X to 150,000,000X
  • 5 axis compu-stage, α: ± 35, β: ± 30 deg
  • Resolution:
    • Poin to point : 0.24 nm
    • Lattice : 0.1 nm
    • STEM : 0.16 nm
  • EDS spectrometer for elemental analysis and mapping
  • BF, DF, HAADF detector
  • Bottom mount CMOS camera with 4kX4K resolution for conventional TEM imaging